1 AFM (Atomic Force Microscope) Analysis
AFM is a very-high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Except the optical picture function, AFM can be provided the dimension measurement.
2 Key Analysis Items
- 3D Structure Inspection
- Determination Morphology Inspection
- Surface Roughness Inspection
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