TEM (Transmission Electron Microscope) Analysis

1 TEM (Transmission Electron Microscope) Analysis

    TEM is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a charge-coupled device.

2 Key Analysis Items

           Crystallization Defect Analysis

           Element Composition Analysis

           Surface Contamination Analysis

           Film and Thickness Analysis