1 Test Purpose
According to the De-cap method to inspect the component internal structure and surface morphology, the technical method of inspecting the inner of the plastic package microcircuit is often applied, which is a destructive physical analysis.
De-capCategory: Chemical and Mechanical De-cap.
2 Typical Case Study
The inner of IC De-cap Micropscope Insepction
3 Test Effect
(1) Batch Quality Uniformity Inspection
(2) Key Process Quality Monitoring
(3) Delivery Component Inspection and Sampling
(4) Out of Storage Re-inspection and Sampling
(5) Daily Inspection or Application Inspection
(6) Identifying and re-New component Assessment
(7) Components Reliability Screening and Qualification
(8) Quality Analysis and Comparison
(9) Control the related process failure mode during Design and Production
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